Consultancy Service - Electron Miscroscopy (Materials Characterisation)

The suite also has capabilities in the area of high resolution TEM imaging utilising the JEOL 100CX. The TEM operates with accelerating voltages up to 20 to a 100kv and has a lattice resolution of better than 0.2nm. The TEM is used to study a wide variety of materials including metal alloys, ceramics and biological specimens at CREST. The TEM is capable of imaging the internal structure of very thin materials and biological samples at magnifications of up to at least 250,000x. As the name suggests, the electrons in a transmission electron microscope pass through the sample and are imaged on a fluorescent screen at the bottom of the microscope column. In this case, the contrast in the image is caused by the electron density of the sample.